Welcome to the Wake Forest University Regional Microscopy Facility. This user facility serves the research community of Wake Forest University as well as the research and engineering communities of the western Carolinas.  The facility specializes in advanced imaging techniques for biological and bio-medically relevant materials, composite materials, interfaces, polycrystalline materials, and nanophase materials.  We are housed in two laboratories: the Deacon Blvd. research facility and the Hanes Building on the Bowman Gray Campus. The facility offers HRTEM, CTEM, FE-SEM, SEM, and a variety of scanning probe microscopies. 

The facility is managed by the Center for Nanotechnology and Molecular Materials at Wake Forest University

---

Electron Microscopy

 

	High Resolution Transmission Electron Microscopy (HRTEM)   Philips CM30 High-resolution bright- and dark-field imaging TEM microprobe and nanoprobe analysis Small-probe convergent beam Large specimen tilt compatible with high resolution Sample size: 3 mm discs < 1 mm thick Point-point resolution: 0.23 nm Line resolution: 0.2 nm
	Conventional Transmission Electron Microscopy (CTEM) Jeol 1200 EX Resolution 0.45 nm point to point 300,000X magnification
	Field Emission Scanning Electron Microscopy (FE-SEM) Jeol JSM 6330 Cold field emission scanning electron microscope. High brightness (large current density) and small beam diameter (high resolution) at low accelerating voltages. Resolution ~ 15 Angstroms depending on the sample.

 

Scanning Probe Microscopy

 

	Atomic Force Microscopy (AFM) Jeol 5200 (Description from the Jeol web site) The JSPM-5200 can be configured as either an atomic force microscope (AFM) or scanning tunneling microscope ( STM ) by merely changing the tip. STM modes include CITS, I-V, S-V, and I-S. Standard AFM modes include contact, friction force microscopy, current image, non-contact and discrete contact with either slope detection or frequency detection, and phase imaging.
	Scanning Tunneling Microscopy (STM) RHK This microscope was developed in cooperation with RHK Technology, Inc.   It is equipped with a cryostat.  The ultra high vacuum system was custom designed and built by Duniway Stockroom Corp.    Further, this STM uses quite low tunneling currents with imaging having been achieved at  tunnel currents below 1 pA.  The system is ideal for studies of nanostructures which might otherwise be damaged by the large field densities wihin the tunneling junction.  Modifications are constantly being made to this machine as we develop new techniques for high precision determinations of electronic phenomena in nanostructures.

 

Optical Microscopy

 

 

 

 

---

 

Using the Facility

Facility hours of operation are 9:00 am to 4:00 pm M-F.

Charges:

Microscope	Charge for external users	Charge for WFU users	Supplies that must be purchased
HRTEM,	$100/hour	$50/hour	grids (film is optional)
CTEM	$100/hour	$50/hour	grids/film/developer
FE-SEM	$100/hour	$50/hour	sample mounts/conductive tape
AFM	$50/hour	$25/hour	tips/sample mounts
STM	$50/Hour	$25/hour	tips
Optical	No Charge	No Charge	none
Individual training	$150/hour	$100/hour	notebook
Users courses are offered each semester. Register through WFU or Forsyth Tech.

 

Schedule by phone: 336 727 1806

Schedule by email: nanotech@wfu.edu

Schedule a training session or enroll in users course:  carroldl@wfu.edu.

All users are required to assume a reasonable responsibility for personal safety, safety of facility personnel as it pertains to their use of the microscopes, and for the microscope being used.